Optical Inline metrology with digital holography: the ongoing path from lab into production (Conference Presentation)
Year: 2025
Type: conference-abstract
DOI: 10.1117/12.3062281
Authors: Daniel Carl, Markus Fratz, Tobias Seyler, Annelie Schiller, Marc Johannes Aslan, Tobias Störk, Alexander Bertz
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413127135