Birefringence metrology analysis for CaF₂
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3062420
Author: Ryker W. Eads
Institution: Corning (United States)
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413127246