Work

Phase-modulated differential confocal microscopy with compensating algorithm against specimen-induced aberration

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3062312

Authors: Johannes Belkner, Jaqueline Stauffenberg, Simon Eisele, Chao Fan, Eberhard Manske, Thomas Kissinger, Thomas Fröhlich

Institution: Technische Universität Ilmenau

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413137337

FWCI:

Cites:

Cited by:

Related to: 10