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Research and Design of Triple Modular Redundancy Technology for Processors Oriented to RISC-V Architecture

Year: 2025

Type: conference-paper

Source: International Conference on Computer Engineering and Application (ICCEA)

DOI: 10.1109/iccea65460.2025.11103375

Authors: Feiyang Li, Huaixiang Hu

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413145187

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