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Digital Twin Maturity Models: Application to a Case Study

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Engineering, Technology and Innovation (ICE/ITMC)

DOI: 10.1109/ice/itmc65658.2025.11106529

Authors: Bruno Dias, Leopoldo O. Silva, Bruno Mota, Patrício Teixeira, Francisco J. Duarte, Ricardo J. Machado

Institutions: Centro de Computação Gráfica, University of Minho

Language: English

Topic: Digital Transformation in Industry

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413145218

FWCI:

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