Work

Detection of Proton Irradiation Damage in 4H-SiC Schottky Diodes Via Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3597973

Authors: Dustin T. Hassenmayer, Patrick M. Lenahan, Edward S. Bielejec, Joshua M. Young, David J. Spry

Institutions: Pennsylvania State University, Sandia National Laboratories, Glenn Research Center

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Air Force Office of Scientific Research, Sandia National Laboratories

Awards: G2156497905, G413247060

OpenAlex ID: W4413156509

FWCI: 0.231

Cites: 29

Cited by: 1

Related to: 10