Work

Simultaneous Enhancement of Electrochemical Migration Lifetime and Reliability of Sintered Silver

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3598109

Authors: Bowen Zhang, Lijia Wang, Yilong Xie, Yiqin Liu, Youzheng Wang, Yi Liu, Yun-Hui Mei

Institution: Tiangong University

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Beijing Municipality, Natural Science Foundation of Tianjin City, Tianjin Municipal Science and Technology Bureau, National Key Research and Development Program of China

Awards: G171544136, G4865024093, G6271869515, G6956979255, G7032451261, G843022060

OpenAlex ID: W4413156526

FWCI: 0.453

Cites: 28

Cited by: 2

Related to: 10