Work

KAM-Net: Kilobyte-Scale Ultralightweight Attention-Based Network for Glass Defect Detection With Algorithm/Hardware Co-Design

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3593602

Authors: Bingrui Zhao, Yaonan Wang, Hui Zhang, Jiaxuan Liu, Jinzhou Zhang

Institutions: Hunan University, Changsha University of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Research and Development Program of Sichuan Province

Awards: G1378316663, G3253534402, G6258236843, G7711720136

OpenAlex ID: W4413157152

FWCI: 0.509

Cites: 25

Cited by: 1

Related to: 10