Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology
Year: 2025
Type: article
Authors: Xun Wang, Jianjun Chen, Bin Liang, Yi Wen, Fan Shen, Yaqing Chi, Deng Luo, Guofang Yu
Institution: National University of Defense Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413157631