Work

Research on PCB Defect Detection Based on Yolo Algorithm

Year: 2025

Type: conference-paper

Source: International Conference on Computer Engineering and Application (ICCEA)

DOI: 10.1109/iccea65460.2025.11103364

Authors: Bei Xie, Mingzhu Luo

Institution: Guangdong University of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Guangdong University of Science and Technology

Award: G8579241696

OpenAlex ID: W4413158498

FWCI: 17.68

Cites: 8

Cited by: 7

Related to: 10