Work

Thermal Degradation Threshold in Ag@Chondroitin Sulfate Memristors Revealed by Temperature‐Resolved Raman Spectroscopy

Year: 2025

Type: article

Source: Journal of Raman Spectroscopy

DOI: 10.1002/jrs.70039

Authors: Alfredo Antonio Alencar Exposito De Queiroz, Alfredo Antonio Alencar Exposito De Queiroz, Marcelo Barbosa de Andrade, Alvaro Antonio Alencar de Queiroz, Alvaro Antonio Alencar de Queiroz

Institutions: Instituto Tecnológico de Aeronáutica, Universidade de São Paulo, Instituto de Pesquisas Energéticas e Nucleares, Instituto de Física de São Carlos, National Nuclear Energy Commission, Universidade Federal de Ouro Preto

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Fundação de Amparo à Pesquisa do Estado de São Paulo, Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Awards: Center of characterization of new mineral species: Raman spectroscopy, electron microprobe and X-ray and neutron diffraction, G3105023747, G585557508

OpenAlex ID: W4413185302

FWCI:

Cites: 48

Cited by:

Related to: 10