Work

Improving Defect Classification in Photovoltaic Modules Using CNN with Attention-Based Processing

Year: 2025

Type: conference-paper

Source: International Conference on Electronics, Energy and Measurement (IC2EM)

DOI: 10.1109/ic2em63689.2025.11100501

Authors: N. Drir, A. Mellit

Institutions: University of Sciences and Technology Houari Boumediene, University of Jijel

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413205136

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Cites: 13

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Related to: 10