Work

Optimization is Key to High-Temperature Reliability in Oxide-Semiconductor FETs

Year: 2025

Type: conference-paper

Source: Conference digest

Authors: Jack C. Evans, Fabia F. Athena, Koustav Jana, Balreen Saini, Shuhan Liu, Ethan Boneh, Paul C. McIntyre, H.-S. Philip Wong

Institution: Stanford University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413205212

FWCI: 2.32

Cites:

Cited by: 1

Related to: 10