Work

Influence Analysis of Charging on mm-Wave OTA Testing

Year: 2025

Type: conference-paper

DOI: 10.1109/iwrfat65352.2025.11102827

Authors: Qiuqin Huang, Siyang Sun, Meijun Qu, Wei He

Institutions: China Academy of Information and Communications Technology, Communication University of China

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G6282355973

OpenAlex ID: W4413205247

FWCI:

Cites: 7

Cited by:

Related to: 10