Work

TR-YOLO: An Enhanced Model for PCB Mixed Defect Detection and Classification

Year: 2025

Type: conference-paper

DOI: 10.1109/eaic66483.2025.11101424

Authors: Vinod Kumar Ancha, Venkateswarlu Gonuguntla, Ramesh Vaddi

Institutions: SRM University, Andhra Pradesh, Symbiosis International University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413205802

FWCI: 2.473

Cites: 24

Cited by: 1

Related to: 10