GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks
Year: 2025
Type: conference-paper
Authors: Samira Nazari, Mahdi Taheri, Ali Azarpeyvand, Mohsen Afsharchi, Christian Herglotz, Maksim Jenihhin
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Deutsche Forschungsgemeinschaft
OpenAlex ID: W4413206105
