Modern differential confocal microscopy for closed-loop measurement of technical surfaces
Year: 2025
Type: article
Source: tm - Technisches Messen
Authors: Johannes Belkner, Thomas Fröhlich
Institution: Technische Universität Ilmenau
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413216102