Work

Defect-Mediated Coexistence of Bipolar Switching and Negative Differential Resistance in Carbon Nanotube–PVA Memristors: Mechanistic Insights and Performance Tuning

Year: 2025

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.5c01076

Authors: Feng Yang, Yangmin Diao, Yongfang Jia, Dongheng Jiang, Jianwei Sun, Keyu Liu, Min Pan, Wensheng Song

Institutions: Southwest Jiaotong University, Sichuan Polytechnic University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Ministry of Education of the People's Republic of China, National High-tech Research and Development Program

Awards: G2897912062, G307029917, G7306111031

OpenAlex ID: W4413238426

FWCI: 0.451

Cites: 36

Cited by: 2

Related to: 10