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Pruned and Low-Rank Optimized Tiny Residual Architecture for Solar Photovoltaic Fault Classification on Edge TPU

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Year: 2025
Type: article
Source: Journal of energy resources technology.
DOI: 10.1115/1.4069350
Authors: Rama Muni Reddy Yanamala, Archana Pallakonda, Rayappa David Amar Raj
Institutions: Indian Institute of Information Technology, Design and Manufacturing, Kancheepuram, Amrita Vishwa Vidyapeetham, National Institute of Technology Warangal
Language: English

Topic: Industrial Vision Systems and Defect Detection
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4413243392
FWCI: 2.594
Cites: 38
Cited by: 5
Related to: 10
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