An Analysis of the Accuracy of the Added Length De-Embedding Methods for Coaxial to Waveguide Adapters in the X-Band
Year: 2025
Type: conference-paper
Abstract: This paper assesses the accuracy of the “added length method” (also known as port extension or channel offset) for de-embedding coaxial-to-waveguide transitions in the X-band, comparing it to full waveguide calibration on both Keysight and Rohde & Schwarz VNAs. The study examines the trade-offs between cost and measurement accuracy, highlighting the feasibility of using these mathematical correction techniques in the absence of dedicated waveguide calibration kits or full S-parameter characterizations of the transitions. The analysis concluded that when using coaxial-to-waveguide transitions the added length method produces accurate results for transmission measurements only.
Authors: Eric Bauman, James DePoy, Sterling Light, Arya Menon, Marco Iskander
Institution: Texas A&M University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4413255667