Weakly Supervised Defect Localization with Residual Features
Year: 2025
Type: conference-paper
Authors: Gaku Minamoto, Satoshi Ito, Osamu Yamaguchi, Takahiro Takimoto
Institution: Toshiba (Japan)
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413277729