Work

Critical review of present-day methodology of thermal imager noise characterization

Year: 2025

Type: article

Abstract: This paper presents a review of reasons that create metrological chaos in the field of characterization of noise in thermal imagers. In detail, the paper presents a critical review of myriads of past and presentday definitions/measurement methods of noise parameters of thermal imagers that create this chaos and significantly reduce reproducibility of measurement of noise parameters carried out by different test teams.

Source: Metrology and Measurement Systems

DOI: 10.24425/mms.2025.154668

Author: Krzysztof Chrzanowski

Institution: Military University of Technology in Warsaw

Language: English

Topic: Advanced Measurement and Detection Methods

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: diamond

OpenAlex ID: W4413287423

FWCI: 0.231

Cites:

Cited by: 1

Related to: 10