Combined Optimization of Both Sensitivity Matrix and Residual Error for Improving EIT Imaging Quality
Year: 2025
Type: article
Abstract: As a visual detection technique, Electrical Impedance Tomography (EIT) can reconstruct the distribution of electrical parameters within a detection field. EIT reconstruction greatly depends on a physical equation that includes a sensitivity matrix and measurements, but the sensitivity matrix fails to be optimized for various reconstruction tasks. This issue decreases the applicable range of the physical equation and EIT reconstruction quality. To address this issue, this paper optimizes both the residual error for measurements and the sensitivity matrix in the equation, which leads to higher EIT reconstruction quality. The optimization solution is theoretically and experimentally verified. Results indicate that the proposed methods can reduce the relative error of EIT reconstruction quality by about 12.0%.
Source: Mathematics
DOI: 10.3390/math13162663
Authors: Jidong Guo, Qiao Xin, Shihong Yue
Institutions: Yili Normal University, Tianjin University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,137
Funder: Yili Normal University
OpenAlex ID: W4413309883
