Work

Investigation of ESD- and EOS-integrated protection devices featuring quick triggering, small snapback voltage and strong robustness

Year: 2025

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/1361-6641/adfd0c

Authors: Kaijun Ding, Jun Sun, Moufu Kong, Jiaru Jia, Shurong Dong, Juin J Liou

Institutions: University of Electronic Science and Technology of China, Zhejiang University, North Minzu University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Sichuan Province Science and Technology Support Program

OpenAlex ID: W4413318089

FWCI:

Cites: 19

Cited by:

Related to: 10