Mitigating TPA-Induced Instability in III-V/Si Hybrid Laser via Reverse-Biased PIN Junctions
Year: 2025
Type: conference-paper
Institution: Shanghai Jiao Tong University
Language: English
Topic: Photonic and Optical Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G8921967184, G915612597
OpenAlex ID: W4413319488
