Work

Fully Automatic Evaluation of IGZO-TFT Model Parameters

Year: 2025

Type: conference-paper

Source: International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)

DOI: 10.1109/yef-ece66503.2025.11117522

Authors: Carolina Almeida, M. Helena Fino

Institutions: Universidade Nova de Lisboa, Uninova

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413320858

FWCI:

Cites: 8

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Related to: 10