Work

Sub-Nanoscale Displacement Measurement by Passive Optics with Elliptically Polarized Reference Light

Year: 2025

Type: conference-paper

Source: OptoElectronics and Communications Conference and International Conference on Photonics in Switching and Computing (OECC/PSC)

DOI: 10.23919/oecc/psc62146.2025.11110012

Authors: Ayumi Ito, Yasuhiro Okamura, Masanori Hanawa

Institution: University of Yamanashi

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413321811

FWCI:

Cites: 4

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Related to: 10