A method for evaluating the comprehensive degradation of circuit breakers based on current curves
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Mingping Zhou, Rongbo Pan, Yixin Xiao, Nan Kong, Wenhao Gong, Xiang Li
Institution: State Grid Corporation of China (China)
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413328137