Work

Study on the type of voltage-to-sheath line short-circuit faults and the characteristics of melt traces

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2025.2426

Authors: Zhiren Tian, Qishen Lv, Bo Gong, Huanhuan Xie, Jinqiang He, Fengyin Zhang

Institution: China Southern Power Grid (China)

Language: English

Topic: Electrical Fault Detection and Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413328567

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