Layer-Wise Decomposition-Based Dual Attention Regression for Industrial Soft Sensing
Year: 2025
Type: article
Source: IEEE Sensors Journal
Authors: Yan-Lin He, Ying-Bo Zhao, Yuan Xu, Qun-Xiong Zhu, Longchuan Li
Institution: Beijing University of Chemical Technology
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G8751590961
OpenAlex ID: W4413359340
