Work

Field-Modulated Redistribution Mechanism of Trapped Charges From TID Irradiation and Experiments in SJ-LDMOS

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3598239

Authors: Zhiqin Zhong, Bo Jiang, Hongbo Li, Gang Yao, Chaoming Liu, Quanyu Zhao, Cen Huang, Zixuan Chen, Fajun Li, Wentong Zhang, Zhaoji Li, Bo Zhang

Institutions: University of Electronic Science and Technology of China, Harbin Institute of Technology, Chinese Academy of Sciences, National Astronomical Observatories

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G1309282516, G5291400582, G6856341117

OpenAlex ID: W4413359432

FWCI: 0.225

Cites: 23

Cited by: 1

Related to: 10