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YOLO-Based Third-Rail Defect Detection With BGAN-Augmented Training

Year: 2025

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2025.3598914

Authors: Ming-An Chung, Chia-Wei Lin, Chen-You Gao, Yi-Xuan Ma, Pu-Chun Chen, Jia-Wei Lin, Chun-Chia Lin

Institution: National Taipei University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science and Technology Council

OpenAlex ID: W4413371241

FWCI: 0.507

Cites: 38

Cited by: 1

Related to: 10