Enhanced Dielectric Energy Storage in Hf0.5Zr0.5O2-Based Oxides by Structure-Evolution Amorphization
Year: 2025
Type: article
Source: ACS Applied Electronic Materials
Institutions: Qingdao University, ShanghaiTech University, Shandong University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1311992632, G841834961
OpenAlex ID: W4413376844
