Modulated amplitude reflectance spectroscopy to map in-channel charge carrier concentration and drift velocity in organic field effect transistors
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0265657
Authors: L. R. McCarthy, G. Partsch, H. Pihlaja, T. Venenciano, Y. Kashtan, J. Woo, T. Xiang, A. Zhao, G. Stecklein, D. Tanenbaum, J. A. Hudgings
Institution: Pomona College
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W4413398790
