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Enhancing In-Situ Monitoring in Additive Manufacturing with Conv1D Autoencoder: A Deep Learning Approach to Analyze Total Electron Emission 1D Signal

Year: 2024

Type: conference-paper

Source: IISE Annual Conference & Expo

DOI: 10.21872/2024iise_8144

Authors: Temilola Gbadamosi-Adeniyi, Trevor McDonald, Scott Ferguson, Tim Horn

Language: English

Topic: Additive Manufacturing Materials and Processes

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413419422

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