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Optimizing Automated Optical Inspection: Enhancing Precision and Efficiency through Adaptive Tolerance Limits with the Find Plane Algorithm

Year: 2024

Type: conference-paper

Source: IISE Annual Conference & Expo

DOI: 10.21872/2024iise_6926

Authors: Nishant Trivedi, Raghabendra Rout, SMART Modular Technologies, Christopher M. Greene, Hetor Vega, SMART Modular Technologies

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413419632

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