A Novel Roughness-based Metric for Uniformity Modeling and Monitoring in High-Temperature Superconductor Manufacturing
Year: 2024
Type: conference-paper
Source: IISE Annual Conference & Expo
Authors: Yanlin Xiang, Kiran Adhikari, Ying Lin, Qianmei Feng, Siwei Chen, Mahesh Paidpilli, Chirag Goel, Venkat Selvamanickam
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W4413419656