Work

Cost-effective ultra-depth-of-field Fourier ptychographic microscopy

Year: 2025

Type: article

Source: Optics Letters

DOI: 10.1364/ol.572022

Authors: Nian Pan, Jingchuan Zuo, Xiuwen Wang, Qun Hao, Shaohui Zhang

Institutions: Beijing Institute of Technology, Beijing Forestry University, Changchun University of Science and Technology

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China

Awards: G4791982026, G6005949099

OpenAlex ID: W4413427815

FWCI:

Cites: 13

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Related to: 10