Work

Analysis of Void Defects in DC TP Cables Based on Partial Discharge Measurements

Year: 2025

Type: conference-paper

Source: IEEE Electrical Insulation Conference (EIC)

DOI: 10.1109/eic63069.2025.11123255

Authors: Chanyeol Ryu, Ho-Seung Kim, Bang-Wook Lee, Hae-Jong Kim, Sugn-Ho Yoon

Institutions: Hanyang University, Korea Electrotechnology Research Institute

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Korea Electrotechnology Research Institute, National Research Council of Science and Technology, Ministry of Science and ICT, South Korea

Award: G8976135302

OpenAlex ID: W4413442529

FWCI:

Cites: 8

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Related to: 10