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Internal Defects Detection in Dielectric Multilayer Structures Using THz Based Technique

Year: 2025

Type: conference-paper

Source: IEEE Electrical Insulation Conference (EIC)

DOI: 10.1109/eic63069.2025.11123314

Authors: A. Benoudina, J. Castellon, S. Agnel, C. Pons, S. Blin, A. Penarier

Institutions: Électricité de France (France), Université de Montpellier, Institut d'Électronique et des Systèmes

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413442787

FWCI:

Cites: 6

Cited by:

Related to: 10