Year: 2025
Type: conference-paper
Abstract: Phase imaging in the terahertz (THz) spectral range has gained significant traction as a potential technique for various industrial applications, including sensing and non-destructive inspection of non-polar material [1]. In this context, THz time-domain spectroscopy (TDS) has offered robust solutions by capturing images that encode hyperspectral amplitude and phase information. In such a direction, researchers have integrated TDS imaging systems with near-field electro-optic sampling [2], [3] or multi-angle illumination [4] approaches to achieve high-resolution imaging solutions. However, TDS-based techniques are frequently constrained by a lack of matrix detectors, leading to time-consuming raster scanning of imaging object. Moreover, TDS imaging systems rely on controllable lab environments and exhibit relatively lower stability.
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
Funder: Agence Nationale de la Recherche
OpenAlex ID: W4413455784