Work

Highly Sensitive Dispersion Characterization of Silicon Nitride Waveguides Using Femtosecond Time-of-Flight Measurements

Year: 2025

Type: conference-paper

DOI: 10.1109/cleo/europe-eqec65582.2025.11109530

Authors: Nathalie Vermeulen, Ryu Niigaki, Takashi Inoue, Hugo Thienpont, Koyo Watanabe

Institutions: Vrije Universiteit Brussel, Hamamatsu Photonics (Japan)

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413456838

FWCI:

Cites: 1

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Related to: 10