Work

High-Resolution and High-Speed EUV Ptychography: Quantitative Imaging With Enhanced Material Contrast

Year: 2025

Type: conference-paper

DOI: 10.1109/cleo/europe-eqec65582.2025.11109452

Authors: Chang Liu, Leona Licht, Wilhelm Eschen, Daniel S. Penagos Molina, Jens Limpert, Jan Rothhardt

Institution: Helmholtz Institute Jena

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413458703

FWCI:

Cites: 6

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Related to: 10