Semiconductor wafer chip defect detection algorithm based on improved YOLOV8
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3071857
Authors: Yue Chen, Huiming Qu
Institution: Nanjing University of Science and Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413465435