Work

Rigorous and efficient diffraction modeling between tilted planes

Year: 2025

Type: conference-paper

Source: International Conference on Optics and Machine Vision (ICOMV)

DOI: 10.1117/12.3071925

Authors: Yiwen Hu, Xin Liu, Xiang Hao

Institutions: Zhejiang University, University of Hong Kong

Language: English

Topic: Electromagnetic Scattering and Analysis

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413465712

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