Work

Novel High-Holding-Voltage Shunt-Triggered SCR for Robust ESD Protection

Year: 2025

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2025.3598828

Authors: Zhao Qi, Junke Li, Hongquan Chen, Xuan Li, Xin Zhou, Ming Qiao, Wenqi Wu, Xin Zhang, Sen Zhang, Nailong He, Zhili Zhang, Zhaoji Li, Bo Zhang

Institutions: University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Guangdong Province, Fundamental Research Funds for the Central Universities

Awards: G212866397, G2514409767, G2534162329

OpenAlex ID: W4413468730

FWCI: 0.451

Cites: 20

Cited by: 2

Related to: 10