Work

Failure Mechanism of Flexible Transparent Conductor Materials under High Current

Year: 2025

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.5c01088

Authors: Su Ding, Zemin Li, Qikun Li, Houlin Zhou, Nuanyang Cui, Long Gu, Wanli Li, Ke Li, Rusen Yang, Zhi Jiang

Institutions: Jiangnan University, Xidian University, Harbin Institute of Technology, University Town of Shenzhen

Language: English

Topic: Nanomaterials and Printing Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Jiangsu Province, Science, Technology and Innovation Commission of Shenzhen Municipality, Fundamental Research Funds for the Central Universities

Awards: G3390994517, G4029811202, G7868522662, G8136576519

OpenAlex ID: W4413487989

FWCI: 0.231

Cites: 40

Cited by: 1

Related to: 10