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A Study on Data-based Wafer Slope Adjustment Strategies for Yield Improvement in Customized Wafer Manufacturing

Year: 2025

Type: article

Source: 한국경영과학회지

DOI: 10.7737/jkorms.2025.50.2.019

Authors: Jun-Hyeok Gil, Jang-Won Bae

Language: English

Topic: Management and Optimization Techniques

Subfield: Strategy and Management

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W4413493947

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