Work

Mathematical Model for Calculating the Failure Cross-section of Microcircuits Under Proton Radiation Exposure

Year: 2025

Type: conference-paper

Abstract: A mathematical model is proposed to estimate the failure cross-section of integrated circuits exposed to high-energy cosmic protons. The model takes into account the sensitive volume geometry, proton energy spectrum, nuclear interaction probability, and energy deposition from secondary particles. Analytical expressions for the rate of single event effects are derived. Graphical dependencies illustrating the effect of microcircuit parameters on radiation resistance are presented, as well as an analysis of the sensitivity of the model to changes in input data.

DOI: 10.58168/phbsc-it2025_95-104

Author: V. Kotlyarov

Institution: Voronezh State University of Forestry and Technologies

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

OpenAlex ID: W4413511743

FWCI:

Cites: 5

Cited by:

Related to: 10