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Enhanced Image Forgery Detection Accuracy Using a SVM over Linear Regression

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Engineering Technologies and Applied Sciences (ICETAS)

DOI: 10.1109/icetas62372.2024.11120222

Authors: P. Sandeep, Uma Priyadarsini P.S, Chethan S, Sanjeev Sharma

Institutions: Saveetha University, University of Technology and Applied Sciences

Language: English

Topic: Digital Media Forensic Detection

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413513853

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Cites: 18

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Related to: 10